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US20170131640A1

Multi-field overlay control in jet and flash imprint lithography

University of Texas System

Abstract

Techniques for delivering sub-5 nm overlay control over multiple fields. One such technique reduces overlay from the wafer side using wafer-thermal actuators. In another technique, the topology of the template is optimized so that the inter-field mechanical coupling between fields in the multi- …

University
University of Texas System
Assignee
Board Of Regents, The University Of Texas System
Inventor
Sidlgata V. Sreenivasan
Priority date
November 05, 2015
Filing date
November 04, 2016
Publication date
May 11, 2017
Language
en
Metadata fetched
August 29, 2026 00:25