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US20180321276A1

Metrology devices and methods for independently controlling a plurality of …

University of Texas System

Abstract

An example metrology device can include a plurality microelectromechanical (MEMS) devices, where each of the MEMS devices has a probe, and a plurality of flexure elements configured to independently displace the MEMS devices. Each of the flexure elements can be coupled to a respective MEMS device, …

University
University of Texas System
Assignee
Board Of Regents, The University Of Texas System
Inventor
Michael CULLINAN
Priority date
November 03, 2015
Filing date
November 03, 2016
Publication date
November 08, 2018
Language
en
Metadata fetched
August 29, 2026 00:26