← All patents

US20180321277A1

Metrology devices for rapid specimen setup

University of Texas System

Abstract

An example metrology device can include a first stage including a microelectromechanical (MEMS) device having a probe, and a second stage configured to hold a sample. The metrology device can also include a kinematic coupler for constraining the first stage in a fixed position relative to the …

University
University of Texas System
Assignee
Board Of Regents, The University Of Texas System
Inventor
Michael CULLINAN
Priority date
November 03, 2015
Filing date
November 03, 2016
Publication date
November 08, 2018
Language
en
Metadata fetched
August 29, 2026 00:26