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US20250104960A1

Operando scanning electron microscopy platform and methods of using the same

University of Texas System

Abstract

Disclosed herein is an operando scanning electron microscopy platform comprising: a first cell comprising: (a) a sample well configured to receive a solid sample having at least one dimension up to about 20 mm; and (b) one or more electron beam transparent coverings positioned above the solid …

University
University of Texas System
Assignee
Board Of Regents, The University Of Texas System
Inventor
Wen Song
Priority date
September 25, 2023
Filing date
September 25, 2024
Publication date
March 27, 2025
Language
en
Metadata fetched
August 29, 2026 00:35