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US6873087B1

High precision orientation alignment and gap control stages for imprint …

University of Texas System

Abstract

Processes and associated devices for high precision positioning of a template an substrate during imprint lithography includes a calibration system with a course calibration stage and a fine orientation stage capable of maintaining a uniform gap between the template and substrate. The fine …

University
University of Texas System
Assignee
Board Of Regents, The University Of Texas System
Inventor
Byung Jin Choi
Priority date
October 29, 1999
Filing date
October 27, 2000
Grant date
March 29, 2005
Publication date
March 29, 2005
Language
en
Metadata fetched
August 28, 2026 23:57