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US6954275B2

Methods for high-precision gap and orientation sensing between a transparent …

University of Texas System

Abstract

Described are high precision gap and orientation measurement methods between a template and a substrate used in imprint lithography processes. Gap and orientation measurement methods presented here include uses of broad-band light based measuring techniques.

University
University of Texas System
Assignee
Boards Of Regents, The University Of Texas System
Inventor
Byung J. Choi
Priority date
August 01, 2000
Filing date
August 01, 2001
Grant date
October 11, 2005
Publication date
October 11, 2005
Language
en
Metadata fetched
August 28, 2026 23:57